We offer various tapes.
Backside Coating Tape
Roll -IR Shielding Type-
The indicated values are measured values and not intended for guarantee use.
| LC2850(25) | LC2850(40) | Measurement Method | ||
|---|---|---|---|---|
| Backside Coating Film（μm） | 25 | 40 | ||
| Appearance | Black | Black | ー | |
| Transmittance (%) | < 5.0 | < 1.0 | Wavelength Range: 190 nm ~ 1600 nm | |
| Weight Loss(%) | 1.1 | 1.1 | Measured by TG-DTA | |
| Adhesion (mN/10 mm) | 5300 | 7100 | Cu foil/ LC Layer / Si Wafer (#2000) | |
| CTE (ppm) | α2 | 110 | 110 | Measured by TMA |
| Wafer Warpage (mm) | < 0.5 | < 0.5 | 8 inch wafer/ 280 μm Thickness | |
| MSL | Level 1 | Level 1 | IR Reflow: 260ºC / 3 times | |
| TCT | Condition G | Condition G | JEDEC STANDARD (JESD22-A104-B) Condition C: -65ºC⇔150ºC x 1000 cycle Condition G: -40ºC⇔125ºC x 1000 cycle |
|
| Impurity Content [ppm] |
Na+ | 0.07 | 0.07 | Measured by Ion Chromatography Extraction Condition Sample: 1 g, Water: 20 ml (121ºC) |
| NH4+ | 5.4 | 5.4 | ||
| Cl- | 2.5 | 2.5 | ||
| Thermal Cure Condition | 130ºC, 2 hrs | 130ºC, 2 hrs | ||
| Remark | Standard | Standard | ||
| LC88-25 | LC88-40 | Measurement Method | ||
|---|---|---|---|---|
| Backside Coating Film（μm） | 25 | 40 | ||
| Appearance | Black | Black | ー | |
| Transmittance (%) | < 1.0 | < 1.0 | Wavelength Range: 190 nm ~ 1600 nm | |
| Weight Loss(%) | 0.9 | 0.9 | Measured by TG-DTA | |
| Adhesion (mN/10 mm) | 12000 | 11500 | Cu foil/ LC Layer / Si Wafer (#2000) | |
| CTE (ppm) | α2 | 110 | 110 | Measured by TMA |
| Wafer Warpage (mm) | < 0.5 | < 0.5 | 8 inch wafer/ 280 μm Thickness | |
| MSL | Level 1 | Level 1 | IR Reflow: 260ºC / 3 times | |
| TCT | Condition C | Condition C | JEDEC STANDARD (JESD22-A104-B) Condition C: -65ºC⇔150ºC x 1000 cycle Condition G: -40ºC⇔125ºC x 1000 cycle |
|
| Impurity Content [ppm] |
Na+ | 0.01 | 0.01 | Measured by Ion Chromatography Extraction Condition Sample: 1 g, Water: 20 ml (121ºC) |
| NH4+ | 4.5 | 4.5 | ||
| Cl- | 2.3 | 2.3 | ||
| Thermal Cure Condition | 140ºC, 2 hrs | 140ºC, 2 hrs | ||
| Remark | High Reliability | High Reliability | ||
Roll -IR Transmission Type-
The indicated values are measured values and not intended for guarantee use.
| LC2826H | LC2846 | Measurement Method | ||
|---|---|---|---|---|
| Backside Coating Film（μm） | 25 | 40 | ||
| Appearance | Black | Black | ー | |
| Transmittance (%) | < 50.0 | < 35.0 | Wavelength Range: 190 nm ~ 1600 nm | |
| Weight Loss(%) | 1.1 | 1.1 | Measured by TG-DTA | |
| Adhesion (mN/10 mm) | 9500 | 8500 | Cu foil/ LC Layer / Si Wafer (#2000) | |
| CTE (ppm) | α2 | 120 | 120 | Measured by TMA |
| Wafer Warpage (mm) | < 0.5 | < 0.5 | 8 inch wafer/ 280 μm Thickness | |
| MSL | Level 1 | Level 1 | IR Reflow: 260ºC / 3 times | |
| TCT | Condition C | Condition G | JEDEC STANDARD (JESD22-A104-B) Condition C: -65ºC⇔150ºC x 1000 cycle Condition G: -40ºC⇔125ºC x 1000 cycle |
|
| Impurity Content [ppm] |
Na+ | 0.02 | 0.02 | Measured by Ion Chromatography Extraction Condition Sample: 1 g, Water: 20 ml (121ºC) |
| NH4+ | 5.6 | 5.6 | ||
| Cl- | 1.5 | 1.5 | ||
| Thermal Cure Condition | 130ºC, 2 hrs | 130ºC, 2 hrs | ||
Precut -IR Shielding Type-
The indicated values are measured values and not intended for guarantee use.
| LC88R25 CXXCE | LC88R40 CXXCE | Measurement Method | ||
|---|---|---|---|---|
| Backside Coating Film（μm） | 25 | 40 | ||
| Appearance | Black | Black | ー | |
| Transmittance (%) | < 1.0 | < 1.0 | Wavelength Range: 190 nm ~ 1600 nm | |
| Weight Loss(%) | 0.9 | 0.9 | Measured by TG-DTA | |
| Adhesion (mN/10 mm) | 12000 | 11500 | Cu foil/ LC Layer / Si Wafer (#2000) | |
| CTE (ppm) | α2 | 110 | 110 | Measured by TMA |
| Wafer Warpage (mm) | < 0.5 | < 0.5 | 8 inch wafer/ 280 μm Thickness | |
| MSL | Level 1 | Level 1 | IR Reflow: 260ºC / 3 times | |
| TCT | Condition C | Condition C | JEDEC STANDARD (JESD22-A104-B) Condition C: -65ºC⇔150ºC x 1000 cycle Condition G: -40ºC⇔125ºC x 1000 cycle |
|
| Impurity Content [ppm] |
Na+ | 0.01 | 0.01 | Measured by Ion Chromatography Extraction Condition Sample: 1 g, Water: 20 ml (121ºC) |
| NH4+ | 4.5 | 4.5 | ||
| Cl- | 2.3 | 2.3 | ||
| Release Force (mN/25 mm) |
340 | 340 | Release Layer / Backside Coating Layer | |
| Thermal Cure Condition | 140ºC, 2 hrs | 140ºC, 2 hrs | ||
Precut -IR Transmission Type-
The indicated values are measured values and not intended for guarantee use.
| LC86R25 CXXCD | LC86R40 CXXCD | Measurement Method | ||
|---|---|---|---|---|
| Backside Coating Film（μm） | 25 | 40 | ||
| Appearance | Black | Black | ー | |
| Transmittance (%) | < 50.0 | < 35.0 | Wavelength Range: 190 nm ~ 1600 nm | |
| Weight Loss(%) | 1.1 | 1.1 | Measured by TG-DTA | |
| Adhesion (mN/10 mm) | 9500 | 8500 | Cu foil/ LC Layer / Si Wafer (#2000) | |
| CTE (ppm) | α2 | 120 | 120 | Measured by TMA |
| Wafer Warpage (mm) | < 0.5 | < 0.5 | 8 inch wafer/ 280 μm Thickness | |
| MSL | Level 1 | Level 1 | IR Reflow: 260ºC / 3 times | |
| TCT | Condition C | Condition G | JEDEC STANDARD (JESD22-A104-B) Condition C: -65ºC⇔150ºC x 1000 cycle Condition G: -40ºC⇔125ºC x 1000 cycle |
|
| Impurity Content [ppm] |
Na+ | 0.02 | 0.02 | Measured by Ion Chromatography Extraction Condition Sample: 1 g, Water: 20 ml (121ºC) |
| NH4+ | 5.6 | 5.6 | ||
| Cl- | 1.5 | 1.5 | ||
| Release Force (mN/25 mm) |
110 | 110 | Release Layer / Backside Coating Layer | |
| Thermal Cure Condition | 130ºC, 2 hrs | 130ºC, 2 hrs | ||